Journal article
Journal of Applied Crystallography, vol. 55, 2022 Jun, pp. 586--591
APA
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Bender, P., Honecker, D., Bersweiler, M., Costo, R., Kahmann, T., Ludwig, F., … Jochum, J. K. (2022). Robust approaches for model-free small-angle scattering data analysis. Journal of Applied Crystallography, 55, 586–591. https://doi.org/10.1107/S1600576722004356
Chicago/Turabian
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Bender, P., D. Honecker, M. Bersweiler, R. Costo, T. Kahmann, F. Ludwig, J. Leiner, and J. K. Jochum. “Robust Approaches for Model-Free Small-Angle Scattering Data Analysis.” Journal of Applied Crystallography 55 (June 2022): 586–591.
MLA
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Bender, P., et al. “Robust Approaches for Model-Free Small-Angle Scattering Data Analysis.” Journal of Applied Crystallography, vol. 55, June 2022, pp. 586–91, doi:10.1107/S1600576722004356.
BibTeX Click to copy
@article{bender2022a,
title = {Robust approaches for model-free small-angle scattering data analysis},
year = {2022},
month = jun,
journal = {Journal of Applied Crystallography},
pages = {586--591},
volume = {55},
doi = {10.1107/S1600576722004356},
author = {Bender, P. and Honecker, D. and Bersweiler, M. and Costo, R. and Kahmann, T. and Ludwig, F. and Leiner, J. and Jochum, J. K.},
month_numeric = {6}
}